Qmax

得邁斯科技代理 Qmax 產品 20 年來一直致力於電路板維修技術跟設備的推展,QT-200 動靜態診斷系統在台灣總共銷售了約有 250 套,使用單位包含有:陸海空軍維修單位、中山科學究院、捷運公司、台灣鐵路局、中國石油、南亞 / 台朔石化產業、半導體廠、面板廠、食品廠、鋼鐵廠...等,相關技術的推展研討會舉辦至少有 100 場的場次,在電路板維修技術的推廣不遺餘力,全新系列的 QT-200NXG 系列產品再次全新登場,更加齊全的電路板維修工具再次來襲 !!

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顯示模式:

電路板測試系統/電路板維修設備 QT200NXG

• 高速USB接口即插即用
• 數位和類比功能測試
• 可編程的驅動和感應準位
• 多功能狀態顯示,帶有電壓/阻抗/引腳標籤/每個引腳的鏈接狀態
• 使用最佳擬合曲線獨特的軟體算法進行高級Qmax簽名方法測試
• 內置邊界掃描控制器和可選的集成BS測試軟體
• 更大的資料庫實力
• RCV測量和示波器實用程序
• 自動待測板電源控制
• 電路追踪工具,用於生成網表信息及線路圖
• 用於開發新設備程序的行業標準模擬器
• 自動上拉和下拉測試集電極和發射極器件

電路板測試系統 BoardWalker 9627

• High-speed USB interface for plug and play
• VHDL based Device Library
• Programmable time base.
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• User defined analog stimulus QSM VI with Best fit Curve unique software algorithm.
• Integrated Boundary scan controller
• Python TD for effective analog device testing
• Inbuilt design Rule checker

電路板測試系統 QT200NXT

• Inbuilt Computer with i3 processor.
• Integrated 12 inch Touch screen industrial monitor
• Digital and analog functional testing
• Programmable derive and sense levels
• Versatile Clip Status display with Voltage / Impedance / Pin Labels / Link Status of every pin.
• Advanced Qmax signature method testing with Best fit Curve unique software algorithm
• In-built-boundary Scan controller and optional integrated BS Test Software.
• Greater library strength
• RCV measurement and oscilloscopes utilities
• Automatic Board Under Test Power Control.
• Circuit Tracing facility For generating net list Information.
• Industry standard Simulator for developing New Device Program
• Automatic pullup and pull down for testing Open collector and Open emitter devices

電路板測試系統 V250

• Incircuit functional test for Digital , analog and mixed signal devices.
• User friendly and powerful Qmax TD6 software.
• QSMVI learn and compare with auto BEST curve fit.
• RLCV and F measurements.
• Board Functional test with automatic guided probe backtracking.
• DC parametric measurements.
• Integrated boundary scan test.
• PXI instrumentation ready.
• Faulty Simulation for TPS validation and test comprehensiveness.
• Faulty dictionary for nil or minimized internal node probing.